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Back-reflection images of dislocations in with densities (a) and (b). Imaging distance . micropipes, BPDs, and phase contrast images from defects of the beryllium windows used at the beamline.
(a) Magnified dislocation images from Fig. 1(a) . The diffraction intensity falls from maximum to zero across the periphery of the white center within . (b) Simulated image. (c) Variation of the image diameters of SSDs with . Inset shows the back-reflection geometry.
(a) Two kinds of BPD contrast in back-reflection topograph. . (b) Contrast mechanisms of edge-type dislocations with opposite Burgers vectors. (c) and (d) are the simulated images of edge dislocations with and , respectively.
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