Full text loading...
(Color online) (a) HRTEM image of a typical defect in the sSi layer on a relaxed SiGe alloy containing 43.9% Ge. The inset shows an enlarged Fourier filtered image around the defect core. (b) Fourier transform of (a).
Fourier filtered image using the Fourier component of Fig. 1(b).
(Color online) Reconstructed phase maps using regions near (a) the Fourier component and (b) the Fourier component in Fig. 1(b).
(Color online) Reconstructed phase maps resolved (a) normal to the substrate ( direction) and (b) in the plane of the substrate ( direction).
(Color online) Relative strain map of (a) the  direction reconstructed from Figs. 4(a) and 4(b) the direction reconstructed from Fig. 4(b).
Article metrics loading...