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Scanning electron and cathodoluminescence imaging of thin film scintillating materials
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10.1063/1.2821115
/content/aip/journal/apl/91/24/10.1063/1.2821115
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2821115
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Figures

Image of FIG. 1.
FIG. 1.

Complementary scanning secondary electron [(a) and (c)] and scanning cathodoluminescence [(b) and (d)] images of identical regions of an LSO:Ce film deposited on rough [(a) and (b)] and smooth [(c) and (d)] alumina substrates. Large images were taken at , and insets were taken at .

Image of FIG. 2.
FIG. 2.

(Color online) Cross-section backscattered electron image of an LSO film deposited on a rough alumina substrate with an inset of an energy dispersive x-ray spectroscopy line scan through the LSO:Ce film/interdiffusion layer/alumina substrate.

Image of FIG. 3.
FIG. 3.

Complementary cross-section backscattered electron (a) and cathodoluminescence (b) images of an LSO:Ce film deposited on a smooth alumina substrate.

Image of FIG. 4.
FIG. 4.

Complementary cross-section backscattered electron (a) and cathodoluminescence (b) images of a delaminated “protrusion” from an LSO:Ce film deposited on a smooth alumina substrate.

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/content/aip/journal/apl/91/24/10.1063/1.2821115
2007-12-10
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scanning electron and cathodoluminescence imaging of thin film Lu2SiO5:Ce scintillating materials
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2821115
10.1063/1.2821115
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