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Analysis of relaxor mechanism and structural distortion for bismuth-layer-structured ceramics
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10.1063/1.2824383
/content/aip/journal/apl/91/24/10.1063/1.2824383
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2824383

Figures

Image of FIG. 1.
FIG. 1.

(Color online) X-ray diffraction pattern and the Rietveld refinement for the ceramic powder, where the red line is the experimental data spectrum, the blue line is the refinement spectrum.

Image of FIG. 2.
FIG. 2.

Fourier transform magnitudes of the Nd edge XAFS spectrum of sample. The inset is the x-ray absorption spectroscopy for Nd edge of sample.

Image of FIG. 3.
FIG. 3.

(a) Selected area electron diffraction (SAED) pattern of along the [001] zone axis. (b) Schematic representation of SAED spectrum of along the [001] zone axis.

Image of FIG. 4.
FIG. 4.

Octahedral tilting from the axis in perovskite layers for .

Image of FIG. 5.
FIG. 5.

Temperature dependence of the dielectric constant of ( and 0.4) samples at frequency.

Tables

Generic image for table
Table I.

X-ray Rietveld refined lattice constant and tilting angle for ( and 0.4)

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/content/aip/journal/apl/91/24/10.1063/1.2824383
2007-12-13
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Analysis of relaxor mechanism and structural distortion for SrBi1.6Nd0.4Nb2O9 bismuth-layer-structured ceramics
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2824383
10.1063/1.2824383
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