Full text loading...
(Color online) X-ray diffraction pattern and the Rietveld refinement for the ceramic powder, where the red line is the experimental data spectrum, the blue line is the refinement spectrum.
Fourier transform magnitudes of the Nd edge XAFS spectrum of sample. The inset is the x-ray absorption spectroscopy for Nd edge of sample.
(a) Selected area electron diffraction (SAED) pattern of along the  zone axis. (b) Schematic representation of SAED spectrum of along the  zone axis.
Octahedral tilting from the axis in perovskite layers for .
Temperature dependence of the dielectric constant of ( and 0.4) samples at frequency.
X-ray Rietveld refined lattice constant and tilting angle for ( and 0.4)
Article metrics loading...