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Submicrometer photoresponse mapping of nanowire superconducting single-photon detectors
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10.1063/1.2824384
/content/aip/journal/apl/91/24/10.1063/1.2824384
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2824384
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Figures

Image of FIG. 1.
FIG. 1.

Photoresponse mapping setup. This configuration affords high resolution scanning over a area without SIL and with SIL. The confocal microscope has a short working distance and high NA. The sample is mounted on a low temperature piezoelectric translation stage. The device is electrically connected for biasing and readout of photodetection events. SSPD, nanowire superconducting single photon detector; SIL, hemispherical solid immersion lens; SMF, single mode optical fiber; cw laser, continuous wave laser. Inset: a scanning electron micrograph (SEM) of a nanowire SSPD as used in this study ( linewidth, period, and area).

Image of FIG. 2.
FIG. 2.

(Color online) Photoresponse signatures of nanowire SSPDs (using setup depicted in Fig. 1). Sample temperature of . (a) Higher detection efficiency (DE) area device. No SIL, , , and scanning area . Inset (i): upper trace, profile of high resolution scan over edge with fit. In the lower trace, the FWHM from the differentiated fit is . Inset (ii): inductance versus bias current at . The inductance at zero bias is and increases by 8% toward the critical current . (b) Lower DE area device. SIL , , , and high resolution scan of area. Inset (i): profiles in orthogonal scanning directions. FWHM from Gaussian fits: 313 and , respectively. Inset (ii): inductance versus bias current at . The inductance at zero bias is and increases by 3% toward the critical current .

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/content/aip/journal/apl/91/24/10.1063/1.2824384
2007-12-13
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Submicrometer photoresponse mapping of nanowire superconducting single-photon detectors
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2824384
10.1063/1.2824384
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