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Temperature-mediated saturation and current-induced recovery of the drift in diodes
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10.1063/1.2824391
/content/aip/journal/apl/91/24/10.1063/1.2824391
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2824391
/content/aip/journal/apl/91/24/10.1063/1.2824391
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/content/aip/journal/apl/91/24/10.1063/1.2824391
2007-12-13
2014-09-02
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Temperature-mediated saturation and current-induced recovery of the Vf drift in 4H-SiCp-i-n diodes
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/24/10.1063/1.2824391
10.1063/1.2824391
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