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Scanning photovoltage microscopy of potential modulations in carbon nanotubes
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10.1063/1.2757100
/content/aip/journal/apl/91/3/10.1063/1.2757100
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/3/10.1063/1.2757100
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) Short-circuit photocurrent microscopy of a pristine CNTFET with one introduced defect . (a) image of the initial CNTFET without defects. The pattern at the contacts is due to the Schottky barriers . (b) image of the same CNTFET with one defect in the middle . (c) image of the same CNTFET at . (This image was taken with chopped laser light and lock-in detection.) [(d) and (e)] Schematic illustration of the band bending under the conditions of (b) and (c).

Image of FIG. 2.
FIG. 2.

(Color online) Short-circuit photocurrent microscopy and spatially resolved Raman scattering on the same CNT . (a) image of the CNTFET. (b) Raman image of the band as a function of position along the CNT. (c) Integrated photocurrent signal along the CNT, used to reconstruct the band bending in the CNT. The band gap and Schottky barrier height are arbitrarily assigned. is the Fermi level. and are the energies of the conduction and valance bands. Dashed lines are a guide to the eye and correlate the local potential maxima with strong -band sites on the CNT.

Image of FIG. 3.
FIG. 3.

(Color online) Effect of an environmental potential step on the short-circuit photocurrent. (a) image of a looped CNT ( source-drain distance). Large regions of an overall negative photoresponse alternate with regions of positive photoresponse. (b) image of the same CNTFET taken with a different scanning direction. [(c) and (d)] Sketch of the sign of the offset in (a) and (b). (e) Line scans along the lines indicated in (a) and (b). The defect-related signal is the same in both scans, but it has a negative offset in (a) and a positive offset in (b). (f) Schematic of the band bending as the environmental potential step is placed in the middle of the device. (g) image of a different CNTFET with strongly coupled tubes at the base of the loop (arrow). The inset shows a scanning electron microscopy image of the device.

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/content/aip/journal/apl/91/3/10.1063/1.2757100
2007-07-16
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Scanning photovoltage microscopy of potential modulations in carbon nanotubes
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/3/10.1063/1.2757100
10.1063/1.2757100
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