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Multicontact measurements of a superconducting Sn nanowire
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10.1063/1.2759471
/content/aip/journal/apl/91/4/10.1063/1.2759471
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/4/10.1063/1.2759471
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Scanning electron micrograph of the Sn nanowire and the pads attached to it. Inset is a zoom of the defect in segment S1. A bias current was applied between the ends of the nanowire.

Image of FIG. 2.
FIG. 2.

(a) Low temperature resistance of the three segments S1, S2, and S3. (b) Evolution of the resistance of S1, S2, and S3 when sweeping up and down the external perpendicular magnetic field at . Resistance measurements were made with a bias current.

Image of FIG. 3.
FIG. 3.

Current-voltage characteristics at of the three segments when the current is swept up and down (open and full markers, respectively). Arrow for S1 indicates a jump.

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/content/aip/journal/apl/91/4/10.1063/1.2759471
2007-07-23
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Multicontact measurements of a superconducting Sn nanowire
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/4/10.1063/1.2759471
10.1063/1.2759471
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