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Object localization with accuracy by x-ray phase contrast projection imaging
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10.1063/1.2757601
/content/aip/journal/apl/91/5/10.1063/1.2757601
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/5/10.1063/1.2757601
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Figures

Image of FIG. 1.
FIG. 1.

(Color online) (A) Sketch of the experimental setup. The entrance of the waveguide is placed in the focal spot of the prefocusing optics. The divergent and highly coherent beam exiting the waveguide illuminates the sample at position . The in-line hologram is recorded at a distance behind the sample. [(B) and (C)] -edge fluorescence emission measured by horizontal translation of the W tip to determine the beam cross section. The measured value increases with , reflecting the expected beam divergence. The solid lines correspond to an error function fit to the data points, while the dashed lines show the (Gaussian) beam profile with parameters from the fit.

Image of FIG. 2.
FIG. 2.

(A) Far-field pattern of the waveguide without sample. (B) Hologram of the FIM tip recorded at and . The highlighted stripe is further analyzed in Fig. 3. (C) Phase shift of the object obtained by holographic reconstruction from (B).

Image of FIG. 3.
FIG. 3.

(Color online) (A) Shift of the interference pattern while translating the sample in the beam. The translation of the object in the entire scan corresponds to . (B) Calibration of the lateral sample position by fitting the central peak in the hologram. The error bars represent the errors of the fitting ( axis) and the encoder precision ( axis), respectively.

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/content/aip/journal/apl/91/5/10.1063/1.2757601
2007-07-31
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Object localization with 10nm accuracy by x-ray phase contrast projection imaging
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/5/10.1063/1.2757601
10.1063/1.2757601
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