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Equivalent point-mass models of continuous atomic force microscope probes
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10.1063/1.2767173
/content/aip/journal/apl/91/5/10.1063/1.2767173
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/5/10.1063/1.2767173
/content/aip/journal/apl/91/5/10.1063/1.2767173
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/content/aip/journal/apl/91/5/10.1063/1.2767173
2007-07-30
2014-10-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Equivalent point-mass models of continuous atomic force microscope probes
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/5/10.1063/1.2767173
10.1063/1.2767173
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