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(Color online) Cross-sectional view of SCT. (a) Substrate depletion mode. (b) Substrate accumulation/inversion mode. is varied by changing the substrate condition.
(Color online) (a) Measured characteristics of SHT-A for various at RT. is . (b) dependence of . (c) Coulomb diagram of SHT-A at RT. Slopes guided with lines are used to calculate the capacitance ratios at the first peak. At higher , slopes decrease and the diamond gets squeezed due to the source/drain capacitance increase by lowering the tunneling barrier. (d) and FWHM of the first CB peak as a function of .
(Color online) (a) Measured characteristics of SHT-B for various at . is . (b) dependence of . (c) Coulomb diagram of SHT-B at . Compared to Fig. 2(c), there is no degradation in CB diamond. (d) and FWHM of the second CB peak as a function of .
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