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(Color online) Angular dependence of at and as a function of film thickness. 90° and 180° represent applied along the axis and axes of the YBCO film, respectively. The inset presents the self-field as a function of film thickness as the film is thinned. The inset’s inset shows a schematic of the bilayer film, with a pronounced density of Y124 intergrowths in the top and nanodots in the bottom.
Cross-sectional TEM images from (a) the top and (b) bottom layer of the bilayer film. A second phase particle is present in the upper left corner of (a). Extensive Y124 intergrowths are seen in (a), while round nanodots are evident in (b).
(Color online) A SEM image (top) of the FIB-cut link that isolated the top layer of the YBCO film for transport measurement. The link was thick and contained only the top layer of the bilayer composite. The majority of the cutting was done at a beam current of to avoid heating the sample, and the total FIB milling time was . Below the SEM image is a schematic of the same link showing the geometry of the current and voltage pads.
(Color online) Angular dependence of at and for the top and bottom layers of the composite individually. The inset presents normalized for the full film thickness as measured and as calculated from the thickness-weighted sum of the individual layers . As we did not measure the top and bottom layers separately for the same link, a direct (unnormalized) comparison was not possible.
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