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Ti-rich and Cu-poor grain-boundary layers of detected by x-ray photoelectron spectroscopy
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10.1063/1.2768006
/content/aip/journal/apl/91/5/10.1063/1.2768006
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/5/10.1063/1.2768006
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

SEM images of cleaved surface (a) and polished surface (b) of ceramics. The insets show the corresponding EDX spectra, respectively. Both of the surfaces were gold coated prior to the SEM observation.

Image of FIG. 2.
FIG. 2.

Core-level spectra of Ca (a), Cu (b), Ti (c), and O (d) for the cleaved and polished surfaces of ceramics.

Image of FIG. 3.
FIG. 3.

(Color online) Analysis on Cu spectra of the cleaved and polished surfaces of ceramics. Note that the background was subtracted by using Shirley-plus-linear method.

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/content/aip/journal/apl/91/5/10.1063/1.2768006
2007-08-02
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Ti-rich and Cu-poor grain-boundary layers of CaCu3Ti4O12 detected by x-ray photoelectron spectroscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/5/10.1063/1.2768006
10.1063/1.2768006
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