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Plot of the grain size change as a function of the layer as deduced by XRD analysis and a typical XRD pattern (taken from multilayer film with layer) can be found in the inset of the figure.
[(a) and (b)] Low magnification cross section TEM images; [(c) and (d)] high angle annular dark field images; [(e) and (f)] high-resolution images; [(g) and (h)] line scan profiles for multilayer film samples with layer , and , respectively.
Plot of the film as a function of layer thickness. The hysteresis loops of several multilayer films with 1, 2, and layer are shown in the inset of the figure.
curves for composite films with 1 and layer thicknesses.
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