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Cross-sectional HRTEM micrograph of an NbN nanofilm grown on a substrate: (a) viewed along the ⟨110⟩ direction for both NbN and SiC showing from the top, the glue (used to prepare the specimen), the NbN film, and the layer. The bar is . (b) Close-up view of the NbN film on and (c) a magnified view of only the NbN film (from another specimen) which shows the monocrystalline structure of the NbN layer.
Bright field image of the NbN layer on a substrate. The inset shows a cross-sectional HRTEM micrograph of the on Si. Electron beam direction is the ⟨110⟩ in both crystals.
Resistance as a function of temperature for both a NbN nanofilm on a substrate and a NbN film on a Si substrate.
Cross-sectional HRTEM micrographs of two thin NbN films grown directly on Si substrates with native oxide, viewed along the ⟨110⟩ direction in Si. The film with a of is shown in (a). The film with a of is shown in (b). The bars are .
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