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Observation of a uniform temperature dependence in the electrical resistance across the structural phase transition in thin film vanadium oxide
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10.1063/1.2767189
/content/aip/journal/apl/91/6/10.1063/1.2767189
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2767189
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) Two-terminal resistance of a thick device is shown vs the temperature . The drop in in the vicinity of with increasing is a signature of the temperature-induced structural transition in this material. Note the hysteresis loop formed by the upsweep and downsweep traces in the figure. The dashed lines convey the approximate relation on both sides of the structural transition in these specimens. The inset exhibits the device geometry. [(b) and (c)] curves are shown for a series of temperatures for (b) the upsweep of the temperature and (c) the downsweep of the temperature.

Image of FIG. 2.
FIG. 2.

(Color online) (a) Two-terminal resistance of thick devices is shown vs the temperature for several lengths of the device. The drop in in all three devices between with increasing is a signature of the -induced structural-transition in this material. Note the similar hysteresis loop in all three devices. The exhibited data traces were collected simultaneously. The dashed lines convey the approximate relation on both sides of the structural transition. (b) The normalized resistance is shown vs for the 400, 200, and long devices of (a).

Image of FIG. 3.
FIG. 3.

(Color online) (a) Two-terminal resistance is shown vs the temperature for a pair of thick devices on the same substrate. The measurements were carried out simultaneously. (b) Two consecutive thermal cycles of vs are shown for a single thick device. Note the change in the width of the hysteresis loop between the first thermal cycle which is made up of traces labeled 1 and 2, and the second thermal cycle which is made up of traces 3 and 4.

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/content/aip/journal/apl/91/6/10.1063/1.2767189
2007-08-07
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Observation of a uniform temperature dependence in the electrical resistance across the structural phase transition in thin film vanadium oxide (VO2)
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2767189
10.1063/1.2767189
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