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Interference method for the determination of the complex refractive index of thin polymer layers
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10.1063/1.2767232
/content/aip/journal/apl/91/6/10.1063/1.2767232
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2767232
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) spectra of 1:1 P3HT:PCBM layers of (solid), (dotted), and (dashed) thickness on glass-Ag substrates. The measured (dot-dash) and calculated (stars) spectra of the substrate are also displayed. (b) Measured at 400 (squares), 550 (triangles), and (stars) on a glass-Ag substrate are shown vs . Calculated fits to the data are shown for 400 (dotted), 550 (solid), and (dashed) lines.

Image of FIG. 2.
FIG. 2.

Calculated and for solar cell mixtures 1:1 P3HT:PCBM (triangles) and 1:4 (squares).

Image of FIG. 3.
FIG. 3.

Measured spectra on glass (lines) vs calculated values from the transmission method (open points) and from ellipsometry (closed points) for a 1:1 mixture of PCBM and P3HT with (squares) and (triangles).

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/content/aip/journal/apl/91/6/10.1063/1.2767232
2007-08-06
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Interference method for the determination of the complex refractive index of thin polymer layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2767232
10.1063/1.2767232
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