Full text loading...
(Color online) Schematic representation of three-point bending experiment setup and the multilayer sample.
(a) SEM image showing the typical grain structure of the surface Au layer in the multilayer. (b) Bright-field TEM cross-sectional micrograph of the multilayer showing regular alignment of columnar grains.
High magnified SEM observation of slip morphology across the grains deformed at the strain rate of (a) with (b) schematic illustration of slip morphology in the grains and (c) .
(Color online) Variation of the mean spacing of the slip planes with grain size showing significant dependence of the corresponding grain size. A typical slip deformed grain was schematically represented in the inset, indicates the thickness of the Au layer.
Article metrics loading...