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Direct observation of dislocation plasticity in scale multilayers
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10.1063/1.2768888
/content/aip/journal/apl/91/6/10.1063/1.2768888
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2768888
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Schematic representation of three-point bending experiment setup and the multilayer sample.

Image of FIG. 2.
FIG. 2.

(a) SEM image showing the typical grain structure of the surface Au layer in the multilayer. (b) Bright-field TEM cross-sectional micrograph of the multilayer showing regular alignment of columnar grains.

Image of FIG. 3.
FIG. 3.

High magnified SEM observation of slip morphology across the grains deformed at the strain rate of (a) with (b) schematic illustration of slip morphology in the grains and (c) .

Image of FIG. 4.
FIG. 4.

(Color online) Variation of the mean spacing of the slip planes with grain size showing significant dependence of the corresponding grain size. A typical slip deformed grain was schematically represented in the inset, indicates the thickness of the Au layer.

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/content/aip/journal/apl/91/6/10.1063/1.2768888
2007-08-08
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct observation of dislocation plasticity in 100nm scale Au∕Cu multilayers
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2768888
10.1063/1.2768888
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