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XRD patterns of as-deposited sample and samples annealed at various temperatures. Inset: (111) peak of as-deposited samples by conventional PLD and magnetic trapping assisted PLD.
TEM images of postannealed nanocomposite thin films (, ). Inset of 2(a) is corresponding select area diffraction pattern.
Representative hysteresis loops of as-deposited (dash line) and postannealed (solid line: ) samples. Inset (a) coercivity variation as a function of annealing temperature; (b) central part of representative hysteresis loops.
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