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Infrared reflection-absorption spectroscopy of thin film on silver surface using synchrotron radiation
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10.1063/1.2768912
/content/aip/journal/apl/91/6/10.1063/1.2768912
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2768912
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Chemical structure and geometrical isomers of .

Image of FIG. 2.
FIG. 2.

Schematic top view of the infrared reflection-absorption spectroscopy system installed at UVSOR-II BL6B. Horizontally polarized parallel IRSR beam is introduced to the off-axis parabolic mirror (Ml, focal length: ) to be focused on the sample with an incident angle of 80° relative to the surface normal. The reflected IR beam is collected by the second off-axis parabolic mirror (M2, focal length: ) and guided to the third off-axis parabolic mirror (M3, focal length: ) to be focused on the detector. The ultrahigh vacuum sample preparation/measurement chamber is separated from the low vacuum mirror chambers by KRS-5 windows.

Image of FIG. 3.
FIG. 3.

Thickness dependence of the IRAS spectra of an film on Ag surface.

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/content/aip/journal/apl/91/6/10.1063/1.2768912
2007-08-10
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Infrared reflection-absorption spectroscopy of Alq3 thin film on silver surface using synchrotron radiation
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2768912
10.1063/1.2768912
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