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(Color online) True stress-strain curve of nanocrystalline-amorphous nanolaminates. The thicknesses of crystalline copper and amorphous are 35 and , respectively. The inset is the cross-sectional transmission electron micrograph of the nanolaminate. The observed tensile behavior is reproducible on the samples prepared at different time periods (also see Ref. 1).
(Color online) Progressive stress-relaxation plots of (a) nanocrystalline-amorphous nanolaminates and (b) crystalline-crystalline copper-stainless steel nanolaminates. The bilayer period for the latter is . The upper left corner inset in (a) is a complete stress-relaxation plot for the nanolaminate.
(Color online) Load-unload multistep stress-relaxation plot shows the reproducible observations of stress decay in nanocrystalline-amorphous nanolaminates at low stress levels.
(Color online) (a) Apparent activation volume and the strain rate sensitivity of nanocrystalline-amorphous nanolaminates at various stress levels. (b) Apparent activation volume vs. stress plotted on a logarithmic scale. The data shown in the figures are obtained from two different stress-relaxation runs on the samples prepared independently at different time periods.
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