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Identification of sub-band-gap absorption features at the interface via spectroscopic ellipsometry
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10.1063/1.2769389
/content/aip/journal/apl/91/6/10.1063/1.2769389
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2769389
/content/aip/journal/apl/91/6/10.1063/1.2769389
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/content/aip/journal/apl/91/6/10.1063/1.2769389
2007-08-10
2014-12-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Identification of sub-band-gap absorption features at the HfO2∕Si(100) interface via spectroscopic ellipsometry
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/6/10.1063/1.2769389
10.1063/1.2769389
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