Influence of crystallographic steps on properties of ferroelectric ultrathin films: An ab initio study
Click to view
(Color online) Stripe domains in compressively strained PZT thin films. Panel (a) corresponds to simulations for a defect-free film of thickness at . Panels (b) and (c) report our numerical predictions for the and configurations in a film with a maximum thickness of and containing a step with a height of at its top (001) surface, respectively. Panels (d), (e), and (f) schematize the domain structures of panels (a), (b), and (c), respectively. Note that panel (f) displays two cross sections: one for the (010) plane located at the step [right side of panel (f)] and another one for the (010) plane located in the thinner part of the film just before the step [left side of panel (f)].
Article metrics loading...
Full text loading...