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Configuration of the misfit dislocation networks in uncapped and capped InN quantum dots
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10.1063/1.2770776
/content/aip/journal/apl/91/7/10.1063/1.2770776
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/7/10.1063/1.2770776
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

High resolution XTEM micrograph of an uncapped InN quantum dot along . The inset is a Fourier filtered image of the interface where an array of MDs is observed.

Image of FIG. 2.
FIG. 2.

(Color online) (a) High resolution XTEM micrograph of a capped InN quantum dot taken along . The inset is a Fourier filtered image of the interface where an increase of the distance between MDs after the capping process is observed. (b) Strain mapping of the image, showing the MD networks at both interfaces.

Image of FIG. 3.
FIG. 3.

(Color online) (a) Plan-view HRTEM image along the [0001] axis of an uncapped InN QD. The top-left inset shows the diffractogram. (b) Strain mapping showing the three families of 60° misfit dislocations.

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/content/aip/journal/apl/91/7/10.1063/1.2770776
2007-08-15
2014-04-24
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Configuration of the misfit dislocation networks in uncapped and capped InN quantum dots
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/7/10.1063/1.2770776
10.1063/1.2770776
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