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(Color) (a) Bubble plot reconstruction of the crystal phase diagram for the composition-spread thin film on Si(001) substrate. The various phases are numbered and listed in Table I (b) HEXRD diffraction image taken from polycrystalline part of the composition spread.
(Color online) (a) Diffraction pattern (central part of the image plate) from the epitaxial perovskite phase for normal incidence. (b) Diffraction pattern from the same phase for an incident angle of 45°. The additional signals (indexed peaks in the figures) originate from unsubtracted thermal diffuse x-ray scattering around Si Bragg peaks. (c) Reconstruction of the reciprocal space for the epitaxial perovskite.
Crystal phases found in the composition spread.
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