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Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films
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10.1063/1.2769759
/content/aip/journal/apl/91/8/10.1063/1.2769759
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/8/10.1063/1.2769759

Figures

Image of FIG. 1.
FIG. 1.

(Color online) Current vs voltage characteristics of (black squares), (green circles), and (red triangles) films.

Image of FIG. 2.
FIG. 2.

(Color online) Cross-sectional TEM image and corresponding EDX profile of film (a) before forming and (b) after forming. EDX profile was scanned through the red lines with resolution. The red squares on the lines represent the position of the top electrode/NiO interfaces depicted as vertical lines on EDX profiles.

Image of FIG. 3.
FIG. 3.

(Color online) (a) (red circles), (black circles), (b) (black circles), and (red circles) dispersions for (open circles), and (solid circles) films according to switching cycles. and are measured at .

Image of FIG. 4.
FIG. 4.

(Color online) Current vs voltage characteristics of films with NiO thickness of (a) 100 and (b) .

Tables

Generic image for table
Table I.

Summary of memory switching parameters shown in Fig. 3.

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/content/aip/journal/apl/91/8/10.1063/1.2769759
2007-08-20
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/8/10.1063/1.2769759
10.1063/1.2769759
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