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Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
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10.1063/1.2775049
/content/aip/journal/apl/91/8/10.1063/1.2775049
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/8/10.1063/1.2775049
/content/aip/journal/apl/91/8/10.1063/1.2775049
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/content/aip/journal/apl/91/8/10.1063/1.2775049
2007-08-24
2014-11-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/8/10.1063/1.2775049
10.1063/1.2775049
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