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Nanoscale disorder in high critical field, carbon-doped hybrid physical-chemical vapor deposition thin films
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10.1063/1.2775088
/content/aip/journal/apl/91/8/10.1063/1.2775088
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/8/10.1063/1.2775088
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) [0001] zone-axis SAD pattern taken from a plan-view C-doped film sample. (b) The model to explain the SAD pattern in (a). (c) HRTEM image taken along [0001] showing an amorphous region between two 30°-rotated grains. The upper-right inset shows a clean boundary between two grains, and the lower-left inset shows two grains with a 4.5° rotation angle with respect to each other.

Image of FIG. 2.
FIG. 2.

(a) -contrast image taken from a plan-view C-doped film sample. [(b) and (c)] CBED patterns taken from spots b and c in (a), respectively. (d) Carbon distribution derived from EELS line scan along the black line in (a).

Image of FIG. 3.
FIG. 3.

(a) zone-axis SAD pattern taken from a cross-sectional C-doped film sample. (b) HRTEM image taken along showing the -axis tilt disorder. (c) BF image taken from the same orientation.

Image of FIG. 4.
FIG. 4.

Schematic drawing showing the microstructure of C-doped films. The arrows indicate grains rotated by 30° and the triangles indicate grains with small-angle rotation about the axis.

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/content/aip/journal/apl/91/8/10.1063/1.2775088
2007-08-24
2014-04-16
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Nanoscale disorder in high critical field, carbon-doped MgB2 hybrid physical-chemical vapor deposition thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/8/10.1063/1.2775088
10.1063/1.2775088
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