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Subnanosecond ellipticity detector for laser radiation
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10.1063/1.2775809
/content/aip/journal/apl/91/9/10.1063/1.2775809
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/9/10.1063/1.2775809
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Design of the detector of radiation ellipticity. The inset shows an oscilloscope trace of a signal pulse of obtained by the detector unit U1.

Image of FIG. 2.
FIG. 2.

Photoresponse of the GaAs (U1, upper panel) and SiGe (U2, lower panel) QWs as a function of the phase angle defined in the inset. The voltage response is measured in both structures along the direction and normalized to the peak signal of each unit. Measurements are presented for and normal incidence of radiation at . The change of the azimuth, the shape of the ellipse, and the direction of rotation of the electric field vector by varying of are sketched above. This variation of light ellipticity is obtained by rotation of the plate with respect to the polarization plane of laser radiation (see inset). Full lines are fits by CPGE (upper panel) and LPGE (lower panel) after Eq. (1). Fits are obtained using only ordinate scaling parameters.

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/content/aip/journal/apl/91/9/10.1063/1.2775809
2007-08-27
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Subnanosecond ellipticity detector for laser radiation
http://aip.metastore.ingenta.com/content/aip/journal/apl/91/9/10.1063/1.2775809
10.1063/1.2775809
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