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(a) Switch structure and (b) current-voltage characteristics of switch with -thick sandwiched between Cu and Pt electrodes. Voltage is applied to Cu electrode. Insert: A schematic cross section of Cu metal precipitated in .
Transmission electron microscope images of switch (a) before turning it on and (b) after turning it on. (c) Spectrum of energy dispersive x-ray spectrometer (EDX). EDX signals from points A and B in (b). Arrows in (c) show Cu-related signals.
(a) Temperature dependence of on resistance . Curves A, B, and C correspond to of 30, 26, and at . Experimental data were fitted using Eq. (1). (b) Temperature coefficient of resistance (, where is residual resistance of at low temperatures). Dotted line shows the temperature coefficient for pure Cu. Data were normalized with resistance at .
Ambient temperature dependence of characteristics in off state. Inset: Schematic view of switch. Conductive path consists of metallic islands separated by tunneling barriers (gaps).
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