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Fine tuning of quantum-dot pillar microcavities by focused ion beam milling
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10.1063/1.2827574
/content/aip/journal/apl/92/1/10.1063/1.2827574
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2827574
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(Color online) (a) SEM image of a pillar with diameter. (b) Blueshift of the fundamental pillar mode with respect to the longitudinal resonance of the planar cavity vs pillar diameter. The solid line is a fit according to Eq. (1) with .

Image of FIG. 2.
FIG. 2.

(Color online) (a) spectra of a pillar for different temperatures. (b) Spectral position of the fundamental pillar mode (squares, error bars show FWHM) and of the pronounced QD emission line (circles) vs temperature. The solid line is a fit by a Bose-Einstein model , where , , and , the dashed line is a guide for the eyes.

Image of FIG. 3.
FIG. 3.

(Color online) spectra of the pillar before and after the FIB polishing step, recorded at (a) and at (b) . The spectra at are plotted on the same linear scale but vertically shifted for clarity.

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/content/aip/journal/apl/92/1/10.1063/1.2827574
2008-01-04
2014-04-17
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Fine tuning of quantum-dot pillar microcavities by focused ion beam milling
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2827574
10.1063/1.2827574
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