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High energy density metal-insulator-metal capacitors with thin films
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10.1063/1.2828700
/content/aip/journal/apl/92/1/10.1063/1.2828700
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2828700
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

X-ray diffraction patterns of films on substrates. The inset shows the AFM plane view showing fine grained microstructure .

Image of FIG. 2.
FIG. 2.

Temperature dependent dielectric constant and loss tangent of thin film at various frequencies. The inset shows the polarization vs voltage curve of the same film at 80 and .

Image of FIG. 3.
FIG. 3.

Schottky [ vs ] and Poole-Frenkel [ vs ] plots of the current vs voltage at various temperatures for thin film .

Image of FIG. 4.
FIG. 4.

log-log plot of current vs voltage at various temperatures. Inset 1 shows the slopes of the straight lines at different voltage regions at . Inset 2 shows the temperature dependence of breakdown field of thin film.

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/content/aip/journal/apl/92/1/10.1063/1.2828700
2008-01-02
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High energy density metal-insulator-metal capacitors with Ba[(Ni1∕2,W1∕2)0.1Ti0.9]O3 thin films
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2828700
10.1063/1.2828700
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