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SEM micrographs of the as-deposited and annealed KNN-LSO films. Annealing was conducted at for . Surface view of (a) as-deposited and (b) annealed films. Cross-sectional view of annealed film at (c) low and (d) high magnifications.
XRD patterns of KNN-LSO starting powder, as-deposited, and annealed films.
Dielectric properties of KNN-LSO films. (a) Dielectric constant and (b) dielectric loss vs frequency.
Polarization vs applied electric field as a function of annealing temperature of the films.
Displacement vs applied voltage. Piezoelectric constant is calculated from linear regression.
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