No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Spatially resolved photocurrent mapping of operating organic photovoltaic devices using atomic force photovoltaic microscopy
5.X. Yang, J. Loos, S. Veenstra, W. J. H. Verhees, M. M. Wienk, J. M. Kroon, M. A. J. Michels, and R. A. J. Janssen, Nano Lett. 5, 579 (2005).
20.V. D. Mihailetchi, H. Xie, B. de Boer, L. M. Popescu, J. C. Hummelen, P. W. M. Blom, and L. J. A. Koster, Appl. Phys. Lett. 89, 012107 (2006).
24.J. McElvain, H. Antoniadis, M. R. Hueschen, J. N. Miller, D. M. Roitman, J. R. Sheats, and R. L. Moon, J. Appl. Phys. 80, 6002 (1996).
Article metrics loading...
A conductive atomic force microscopy (cAFM) technique, atomic force photovoltaicmicroscopy (AFPM), has been developed to characterize spatially localized inhomogeneities in organic photovoltaic (OPV) devices. In AFPM, a biased cAFM probe is raster scanned over an array of illuminated solar cells, simultaneously generating topographic and photocurrent maps. As proof of principle, AFPM is used to characterize poly(3-hexylthiophene):[6,6]-phenyl--butyric acid methyl ester OPVs, revealing substantial device to device and temporal variations in the short-circuit current. The flexibility of AFPM suggests applicability to nanoscale characterization of a wide range of optoelectronically active materials and devices.
Full text loading...
Most read this month