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Effect of epitaxial strain on ferroelectric polarization in multiferroic films
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10.1063/1.2830799
/content/aip/journal/apl/92/1/10.1063/1.2830799
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2830799
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

HR-XRD reciprocal space maps around the 113 reflections of (a) and (b) -thick films on (001) substrates. The vertical and horizontal axes correspond to the out-of-plane and in-plane directions, respectively.

Image of FIG. 2.
FIG. 2.

(a) In-plane (, purple circles) and out-of-plane (, blue squares) lattice parameters, (b) ratio, and (c) (red circles) and (blue squares) of the films with varying thicknesses. The dotted rectangle represents the fully strained thickness range. The dash-dotted horizontal lines are guides to the eye.

Image of FIG. 3.
FIG. 3.

(a) curves of samples comprised of the films (120 and in thickness) and the (001) substrates measured at room temperature. (b) data of the same films after subtracting the diamagnetic contribution from the substrate. (c) loops of 77- and -thick films measured at a frequency of . (d) Frequency dependence of loops of the -thick film. The inset in (d) shows of the same film as a function of the maximum applied . All the measurements were performed at .

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/content/aip/journal/apl/92/1/10.1063/1.2830799
2008-01-04
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Effect of epitaxial strain on ferroelectric polarization in multiferroic BiFeO3 films
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2830799
10.1063/1.2830799
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