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Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study
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10.1063/1.2830814
/content/aip/journal/apl/92/1/10.1063/1.2830814
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2830814
/content/aip/journal/apl/92/1/10.1063/1.2830814
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/content/aip/journal/apl/92/1/10.1063/1.2830814
2008-01-07
2014-10-01
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Localized breakdown in dielectrics and macroscopic charge transport through the whole gate stack: A comparative study
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/1/10.1063/1.2830814
10.1063/1.2830814
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