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XRD pattern of (Zn,Cr)Te film with the standard ZnTe reference pattern.
(a) Plan-view HRTEM picture and (b) EDX mapping of the emission intensity for the (Zn,Cr)Te film.
(a) Hysteresis loop of the sample at with applied magnetic field in the film plane. Inset shows the hysteresis loop in the scale, (b) FC magnetization as a function of the temperature under the applied field of , and ZFC magnetization measurement at various applied fields.
(a) MCD spectrum at , (b) normalized MCD intensity and curve of the (Zn,Cr)Te film, (c) temperature dependent resistance, and (d) MR curves measured with magnetic field perpendicular to current direction at different temperatures. Inset shows the MR measured with magnetic field parallel to current direction at .
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