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Collecting photoelectrons with a scanning tunneling microscope nanotip
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10.1063/1.2894186
/content/aip/journal/apl/92/10/10.1063/1.2894186
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2894186
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Figures

Image of FIG. 1.
FIG. 1.

Geometric arrangement of the tip and surface used in our simulation and definition of the effective probing diameter. In simulation, only the tip-apex region can receive photoelectrons; most of the tip is considered nonconductive. With the work function of the metal surface set at and the emission probability as , this plot shows the relative extent of photoelectrons capable of reaching the bare tip region as a function of their emission positions. According to this plot, the effective probing diameter is defined as the region producing 90% of the photocurrent collected by the tip. The dip of photocurrent appearing at is due to the finite grid numbers used to describe the tip apex.

Image of FIG. 2.
FIG. 2.

Dependences of on parameters , , and . (a) Probing diameter vs separation between tip and surface is examined for several values of . (b) Probing diameter vs voltage bias at . The relevant dimension appearing in both cases clearly demonstrates how distant photoelectrons affect .

Image of FIG. 3.
FIG. 3.

Radiation from a synchrotron incident on a metal surface generates a wide spectrum of excited electrons, but not all leave the surface like those in group A. A metallic tip placed near a surface eliminates a constraint posted by a critical angle of total reflection and allows excited electrons marked as groups B and C to reach the tip via tunneling under the effective work functions and .

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/content/aip/journal/apl/92/10/10.1063/1.2894186
2008-03-10
2014-04-23
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Collecting photoelectrons with a scanning tunneling microscope nanotip
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2894186
10.1063/1.2894186
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