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Time-resolved measurement of the local lattice temperature in terahertz quantum cascade lasers
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10.1063/1.2894585
/content/aip/journal/apl/92/10/10.1063/1.2894585
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2894585
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Figures

Image of FIG. 1.
FIG. 1.

Schematics of the time-resolved PL experiments. (a) ICCD trigger signal. (b) Voltage pulse delayed by the time . (c) CCD gate opened before, during, and after the voltage pulse. [(d)–(f)] Representative PL spectra collected at a heat sink temperature , with a time delay of (d) , (e) , and (f) . The QCL operated in pulsed mode with a frequency , , and an instantaneous electrical power .

Image of FIG. 2.
FIG. 2.

(a) Difference between the lattice temperature and the heat sink temperature plotted as a function of time in the substrate , in pulsed operation at with a , while an instantaneous electrical power is applied to the device. The dashed lines at and are best solutions of the heat equation during and after the pulse, respectively. Inset: schematic of the investigated QCLs front facet. The dashed line indicates the locations along the device centre investigated by microprobe PL. (b) Difference between the lattice temperature and the heat sink temperature plotted as a function of time close to the top of the active region . The pulse frequency is . The PWs are: (bottom), , , , and (top) and an instantaneous electrical power is applied to the device. The dashed lines are biexponential fits to the data. Inset: experimental temperature profile measured at a heat sink temperature , along the axis in the device center, for the investigated QCL driven by an electrical power at a duty cycle of 8%.

Image of FIG. 3.
FIG. 3.

(a) Heating thermal time constants (▾) and (▴), plotted as a function of the PW, as extracted from the biexponential fit shown in Fig. 2. (a) Cooling time constants (●) and (◼), plotted as a function of the PW, as extracted from the biexponential fits of Fig. 2. The device operated at in pulsed mode with . (c) Averaged difference between the lattice temperature and the heat sink one, in the active region of the investigated device measured as a function of the mean electrical power. The experimental points correspond to device operation in pulsed mode with duty cycles equal to 1.2%, 2%, 4%, 6%, and 8%.

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/content/aip/journal/apl/92/10/10.1063/1.2894585
2008-03-12
2014-04-21
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Time-resolved measurement of the local lattice temperature in terahertz quantum cascade lasers
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2894585
10.1063/1.2894585
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