1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Near-field optical characterization of surface-plasmon-mediated light emission from electrically biased metal-insulator-semiconductor tunnel junctions
Rent:
Rent this article for
USD
10.1063/1.2898201
/content/aip/journal/apl/92/10/10.1063/1.2898201
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2898201
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Current-voltage characteristics and (b) light emission spectra of two representative MIS junctions consisting of -silicon/oxide/gold stacks.

Image of FIG. 2.
FIG. 2.

(a) SNOM image taken on the top electrode of a MIS tunnel junction, image size of ; (b) high-resolution SNOM image of a substructure found within a bright spot of the kind seen in (a); (c) cross section along the dashed line in (b), demonstrating strong localization with a spot diameter less than the wavelength of light (cps denotes “counts per second”).

Image of FIG. 3.
FIG. 3.

(a) scan recorded by tip retraction above a hot spot; (b) single scan from which both surface-bound (exponentially decaying) and propagating (long-ranging) contributions can be deduced. The data were recorded in a wavelength interval of roughly . Scale bars are (horizontal) and (vertical).

Image of FIG. 4.
FIG. 4.

Spectrally resolved near-field images of two bright spots taken with different band-pass filters each having a full width at half maximum of . The center wavelengths were (a) , (b) , (c) , (d) , (e) , (f) , (g) , and (h) . Note the ruler. The data have been corrected for the transmittance of each individual filter as well as for the spectrally varying quantum efficiency of the detector.

Loading

Article metrics loading...

/content/aip/journal/apl/92/10/10.1063/1.2898201
2008-03-13
2014-04-20
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Near-field optical characterization of surface-plasmon-mediated light emission from electrically biased metal-insulator-semiconductor tunnel junctions
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2898201
10.1063/1.2898201
SEARCH_EXPAND_ITEM