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(a) Current-voltage characteristics and (b) light emission spectra of two representative MIS junctions consisting of -silicon/oxide/gold stacks.
(a) SNOM image taken on the top electrode of a MIS tunnel junction, image size of ; (b) high-resolution SNOM image of a substructure found within a bright spot of the kind seen in (a); (c) cross section along the dashed line in (b), demonstrating strong localization with a spot diameter less than the wavelength of light (cps denotes “counts per second”).
(a) scan recorded by tip retraction above a hot spot; (b) single scan from which both surface-bound (exponentially decaying) and propagating (long-ranging) contributions can be deduced. The data were recorded in a wavelength interval of roughly . Scale bars are (horizontal) and (vertical).
Spectrally resolved near-field images of two bright spots taken with different band-pass filters each having a full width at half maximum of . The center wavelengths were (a) , (b) , (c) , (d) , (e) , (f) , (g) , and (h) . Note the ruler. The data have been corrected for the transmittance of each individual filter as well as for the spectrally varying quantum efficiency of the detector.
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