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Real-time thermal imaging of catastrophic optical damage in red-emitting high-power diode lasers
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10.1063/1.2898202
/content/aip/journal/apl/92/10/10.1063/1.2898202
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2898202
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

(a) Optical NF intensity taken from the maximal lines of the CCD camera vs driving current. The COD occurred between 2.02 and . Equipotential lines at intensities of 1,2,3,4, and 5 are given. (b) Raw TI images of the front facet before, at, and after COD at the location indicated by an arrow (top to bottom). The dimensions of the diode ( width) are indicated by the dotted white line and the submount is shaded.

Image of FIG. 2.
FIG. 2.

Temperature increases of a single pixel (red line) and the entire semiconductor chip with respect to the submount. (a) For a current ramp between 0 and and (b) expanded around the COD event. The black dots are shifted up for comparison.

Image of FIG. 3.
FIG. 3.

(a) Absolute temperature profiles taken from Fig. 1 along a line that contains the active region. The temperature flash at COD (green line) and the subsequent average temperature jump (red line) are visible. (b) Corresponding NF profiles before and after COD [black and red lines as in (a)]. The dotted blue line represents the highest NF intensity observed at .

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/content/aip/journal/apl/92/10/10.1063/1.2898202
2008-03-13
2014-04-25
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Real-time thermal imaging of catastrophic optical damage in red-emitting high-power diode lasers
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2898202
10.1063/1.2898202
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