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Cantilever based optical interfacial force microscope
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10.1063/1.2898524
/content/aip/journal/apl/92/10/10.1063/1.2898524
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2898524
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

A schematic diagram of the COIFM with voltage activated force feedback using an optical beam deflection detection method. The system consisted of a LS AutoProbe AFM with a DMASP tip interfaced with a RHK SPM100 controller.

Image of FIG. 2.
FIG. 2.

(a) A square wave ac signal with a frequency of as a set-point voltage of the feedback loop. (b) The deflection signal that follows the set-point voltage. (c) The error signal between and (d) The signal sent from the controller to the ZnO stack material.

Image of FIG. 3.
FIG. 3.

(a) A force-displacement curve between the tip and the silicon surface obtained without a force activated voltage feedback system. (b) The force applied to the ZnO stack material graphed as a function of tip and silicon sample distance. (inset) Enlarged force-distance curve between 0 and 3 nm. (c) Force-distance curve between the tip and the silicon surface obtained with a force activated voltage feedback system.

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/content/aip/journal/apl/92/10/10.1063/1.2898524
2008-03-14
2014-04-20
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Cantilever based optical interfacial force microscope
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/10/10.1063/1.2898524
10.1063/1.2898524
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