Full text loading...
A schematic diagram of the COIFM with voltage activated force feedback using an optical beam deflection detection method. The system consisted of a LS AutoProbe AFM with a DMASP tip interfaced with a RHK SPM100 controller.
(a) A square wave ac signal with a frequency of as a set-point voltage of the feedback loop. (b) The deflection signal that follows the set-point voltage. (c) The error signal between and (d) The signal sent from the controller to the ZnO stack material.
(a) A force-displacement curve between the tip and the silicon surface obtained without a force activated voltage feedback system. (b) The force applied to the ZnO stack material graphed as a function of tip and silicon sample distance. (inset) Enlarged force-distance curve between 0 and 3 nm. (c) Force-distance curve between the tip and the silicon surface obtained with a force activated voltage feedback system.
Article metrics loading...