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High spatial resolution SXCL using the cluster soft x-ray source with the LiF detectors. (a) Image of mesh. (b) Image of polypropylene foil and traces along it together with trace of Mo foil (see also Fig. 3).
Nanostructure imaging of the damaged (swirled) Mo foil using the cluster soft x-ray source with the LiF detector. Red dashed lines on the left plot show calculated levels of signal for different number of Mo layers, normalized to the intensity of the open area of the detector.
Number of photons, source size, and brightness for two different line emissions from clusters with different gas targets.
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