1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Incorporation of Ga in epitaxial films
Rent:
Rent this article for
USD
10.1063/1.2905284
/content/aip/journal/apl/92/13/10.1063/1.2905284
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/13/10.1063/1.2905284
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

CL spectrum obtained by exciting a area of the surface of the sample.

Image of FIG. 2.
FIG. 2.

Micro-Raman line scan spectra (left), SEM micrograph (center left), pseudocolor representation of the SEM-CL line scan (center right), and the corresponding spectra (right) recorded from the cross section of the sample.

Image of FIG. 3.
FIG. 3.

TEM image of the interface.

Image of FIG. 4.
FIG. 4.

Impurity concentration profile resulting from the energy shift in Fig. 2 and applying Eq. (4).

Loading

Article metrics loading...

/content/aip/journal/apl/92/13/10.1063/1.2905284
2008-04-01
2014-04-23
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Incorporation of Ga in ZnO∕GaN epitaxial films
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/13/10.1063/1.2905284
10.1063/1.2905284
SEARCH_EXPAND_ITEM