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CL spectrum obtained by exciting a area of the surface of the sample.
Micro-Raman line scan spectra (left), SEM micrograph (center left), pseudocolor representation of the SEM-CL line scan (center right), and the corresponding spectra (right) recorded from the cross section of the sample.
TEM image of the interface.
Impurity concentration profile resulting from the energy shift in Fig. 2 and applying Eq. (4).
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