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Experimental evidence for a surface distribution of two-level systems in superconducting lithographed microwave resonators
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10.1063/1.2906373
/content/aip/journal/apl/92/15/10.1063/1.2906373
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/15/10.1063/1.2906373

Figures

Image of FIG. 1.
FIG. 1.

An illustration of the CPW coupler and resonator. The inset shows a cross-sectional view of the CPW. The contour of the metal surface and the contour of the exposed surface of the substrate are indicated by the solid line and the dashed line, respectively.

Image of FIG. 2.
FIG. 2.

Fractional frequency shift as a function of temperature. is calculated by using . The temperature sweep is in steps of from and in steps of above . The markers represent different resonator geometries, as indicated by the values of the center strip width in the legend. The dashed lines indicate fits to the TLS theory [Eq. (2)].

Image of FIG. 3.
FIG. 3.

The scaling of the measured values of the kinetic inductance and TLS filling factor , as well as the calculated values of the CPW geometrical factors and , are shown as a function of the resonator center strip width . The top panel shows the ratios of , , , and to their values for the resonators. The bottom panel shows these ratios normalized by the kinetic inductance ratio .

Tables

Generic image for table
Table I.

Values and ratios.

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/content/aip/journal/apl/92/15/10.1063/1.2906373
2008-04-17
2014-04-18
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Experimental evidence for a surface distribution of two-level systems in superconducting lithographed microwave resonators
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/15/10.1063/1.2906373
10.1063/1.2906373
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