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In situ TEM deformation holder coupled with external drive mechanism.
Two TEM micrographs from the series of micrographs as a function of strain (with increments of about a strain of ) showing fringes caused by twin formation. (a) Shockley partial dislocation emission from G1 along P1 meets obstacle at 2 and cross slips along C1. (b) Thickening of twin on both planes as a function of increasing strain.
Enlarged TEM images from Fig. 2. (a) and (b) are from Fig. 2(a) and (c) is from Fig. 2(b).
Partial dislocation reactions and their reactions in the primary plane P1, (111), and cross-slip plane C1, .
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