Full text loading...
Scanning electron microscope (SEM) images of mesas with an oxidized AlInN sacrificial layer: (a) bulk oxide; (b) porous oxide; (c) complete etch.
SEM images of (a) an oxidized mesa with a porous layer and (b) a GaN -disk obtained after and protective cap removal.
(a) RT spectrum of bare QWs (blue line) and multimode structure of a single wide -disk; (b) Experimental factors of the WGMs vs wavelength and corresponding -disk absorption coefficient. The dashed lines are exponential fits used as guides for the eyes.
(a) and (b) Evolution of the RT emission spectrum when increasing the density of the excitation for samples with low and high In content, respectively. (c) Mode intensity plotted as a function of the peak power density demonstrating a clear lasing threshold of at and at . (d) and (e) Optical microscope images in false colors (same hue, saturation, and brightness values) of the emission pattern above lasing threshold for wide -disks emitting at 409 and , respectively.
Article metrics loading...