1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
High quality nitride based microdisks obtained via selective wet etching of AlInN sacrificial layers
Rent:
Rent this article for
USD
10.1063/1.2917452
/content/aip/journal/apl/92/17/10.1063/1.2917452
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/17/10.1063/1.2917452
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Scanning electron microscope (SEM) images of mesas with an oxidized AlInN sacrificial layer: (a) bulk oxide; (b) porous oxide; (c) complete etch.

Image of FIG. 2.
FIG. 2.

SEM images of (a) an oxidized mesa with a porous layer and (b) a GaN -disk obtained after and protective cap removal.

Image of FIG. 3.
FIG. 3.

(a) RT spectrum of bare QWs (blue line) and multimode structure of a single wide -disk; (b) Experimental factors of the WGMs vs wavelength and corresponding -disk absorption coefficient. The dashed lines are exponential fits used as guides for the eyes.

Image of FIG. 4.
FIG. 4.

(a) and (b) Evolution of the RT emission spectrum when increasing the density of the excitation for samples with low and high In content, respectively. (c) Mode intensity plotted as a function of the peak power density demonstrating a clear lasing threshold of at and at . (d) and (e) Optical microscope images in false colors (same hue, saturation, and brightness values) of the emission pattern above lasing threshold for wide -disks emitting at 409 and , respectively.

Loading

Article metrics loading...

/content/aip/journal/apl/92/17/10.1063/1.2917452
2008-04-28
2014-04-18
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: High quality nitride based microdisks obtained via selective wet etching of AlInN sacrificial layers
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/17/10.1063/1.2917452
10.1063/1.2917452
SEARCH_EXPAND_ITEM