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Atomic force microscopy measurement of the Young’s modulus and hardness of single nanowires
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10.1063/1.2919718
/content/aip/journal/apl/92/17/10.1063/1.2919718
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/17/10.1063/1.2919718
/content/aip/journal/apl/92/17/10.1063/1.2919718
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/content/aip/journal/apl/92/17/10.1063/1.2919718
2008-05-02
2014-12-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Atomic force microscopy measurement of the Young’s modulus and hardness of single LaB6 nanowires
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/17/10.1063/1.2919718
10.1063/1.2919718
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