1887
banner image
No data available.
Please log in to see this content.
You have no subscription access to this content.
No metrics data to plot.
The attempt to load metrics for this article has failed.
The attempt to plot a graph for these metrics has failed.
Resonant x-ray scattering from self-assembled islands: Understanding the chemical structure of quaternary quantum dots
Rent:
Rent this article for
USD
10.1063/1.2820756
/content/aip/journal/apl/92/2/10.1063/1.2820756
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2820756
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

AFM images of samples (a) A and (b) B. The volume of the dots decrease as temperature rises. (c) and (e) are scans for the samples at the Ga edge and below it, (d) and (f) show scans at the As edge and below it. The contrast observed in all scans is directly related to the presence of Ga or As. The GaAs (220) diffraction peak is not shown for clarity.

Image of FIG. 2.
FIG. 2.

(a) Angular scans of sample A yielding the dots size-lattice parameter relationship for different values. [(b) and (c)] QDs lateral width as function of . (d) and (e) show concentration profiles for all chemical elements as function of .

Image of FIG. 3.
FIG. 3.

Concentration maps for all chemical elements present for QD samples grown at (A) and (B) .

Loading

Article metrics loading...

/content/aip/journal/apl/92/2/10.1063/1.2820756
2008-01-14
2014-04-25
Loading

Full text loading...

This is a required field
Please enter a valid email address
752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: Resonant x-ray scattering from self-assembled InP∕GaAs(001) islands: Understanding the chemical structure of quaternary quantum dots
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2820756
10.1063/1.2820756
SEARCH_EXPAND_ITEM