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On-wafer microwave signal-to-noise enhancer using NiFe films
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10.1063/1.2827576
/content/aip/journal/apl/92/2/10.1063/1.2827576
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2827576
View: Figures

Figures

Image of FIG. 1.
FIG. 1.

Geometry of the experimental waveguide structures.

Image of FIG. 2.
FIG. 2.

Transmission as a function of the frequency for different applied fields and input power levels. The top and bottom rows represent results for samples 1 and 2, respectively.

Image of FIG. 3.
FIG. 3.

Bias field, FMR linewidth, instability threshold power, and filtering level as a function of the FMR frequency. Open (filled) symbols indicate results for sample 1 (2).

Image of FIG. 4.
FIG. 4.

FMR absorption as a function of the input power for samples 1 (top) and 2 (bottom).

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/content/aip/journal/apl/92/2/10.1063/1.2827576
2008-01-17
2014-04-19
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752b84549af89a08dbdd7fdb8b9568b5 journal.articlezxybnytfddd
Scitation: On-wafer microwave signal-to-noise enhancer using NiFe films
http://aip.metastore.ingenta.com/content/aip/journal/apl/92/2/10.1063/1.2827576
10.1063/1.2827576
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